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Standard IEC standard · IEC 60747-5-3:1997

Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods

Status: Withdrawn

· Replaced by: IEC 60747-5-5:2007/AMD1:2013 , IEC 60747-5-4:2006 , IEC 60747-5-6:2016 , IEC 60747-5-7:2016 , IEC 60747-5-5:2007 Amended by: IEC 60747-5-3:1997/AMD1:2002
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Standard IEC standard · IEC 60747-5-3:1997

Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods
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Scope
Describes the measuring methods applicable to the optoelectronic devices which are not intended to be used in the fibre optic systems or subsystems.

Subjects

Optoelectronics, laser equipment (31.260)

Buy this standard

Standard IEC standard · IEC 60747-5-3:1997

Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods
Subscribe on standards with our subscription service. When you use our service you can be assured the latest editions and easy access. Read more about SIS Subscriptions
Subscribe on standards - Read more Dölj
Price: 4 095 SEK
standard ikon pdf

PDF

Price: 4 095 SEK
standard ikon

Paper

Show more Show less

Product information

Language: English French

Written by: IEC

International title:

Article no: STD-124433

Edition: 1

Approved: 9/5/1997

No of pages: 61

Replaces: IEC 60747-5:1992/AMD2:1995 , IEC 60747-5:1992/AMD1:1994 , IEC 60747-5:1992

Replaced by: IEC 60747-5-5:2007/AMD1:2013 , IEC 60747-5-4:2006 , IEC 60747-5-6:2016 , IEC 60747-5-7:2016 , IEC 60747-5-5:2007